International Vision Expo East was once again the premier venue for attendees who came to the Javits Convention Center in New York City from March 26 to 29 to see and purchase the latest products, as well as to learn new skills to help them grow their practices and businesses. This year, many Expo attendees, conscious of the current economic crisis, said they were walking the aisles of the exhibit hall with a greater sense of purpose and a sharper focus on maximizing their Expo experience.


The conference and show finished on a high note for most exhibitors, despite the economy. In a statement from show organizers, Tom Loughran, event director for Reed Exhibitions, said, While preliminary attendance figures indicate that we are down approximately 12% in our attendance, we were very pleased to hear positive feedback from both attendees and exhibitors at the show. A complete third-party audit of International Vision Expo East will be available soon, Mr. Loughran said.


This years show featured a new New York themed floor layout, highlighting Manhattan street names and organizing exhibitors into eyewear, lenses and technology and medical/scientific areas, in addition to dedicated halls for the Galleria and Underground.


On the continuing education front, the first-time Visionomics conference program focused on actionable strategies to help ECPs identify business opportunities and increase efficiencies.


In addition, a roster of celebrities created additional excitement on the show floor, among them: Randy Jackson for Zyloware, Kay Unger for Nouveau, Paris Hilton at Gripping Eyewear, Ron Jaworski for A&A Optical, and Steven Cojo Cojocaro, who hosted the Safilo fashion shows. Guest appearances at Revolution featured Mike Piazza, Mickey Rourke and Kara DioGuardi.


Summing up the feeling at the show: What bad economy? asked Roger Shyer of Eastern States Eyewear.


For VisionMondays complete coverage of International Vision Expo East, go to www.vision
monday.com/ViewContent/tabid/211/content_id/13101/catId/295/Default.aspx.

Vol. No: 146:06Issue: 6/15/2009